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3M(TM) PLCC Surface Mount Test Clips
The PLCC surface mount test clips allow convenient testing of plastic leaded chip carriers of surface mount ICs. Industry standard 0.025" square contact pins with helical compression springs to make positive contact during testing.
3M(TM) LCC Surface Mount Test Clips
LCC surface mount test clips allow convenient testing of leadless chip carriers of surface mount ICs. Industry standard .025" square contact pins with helical compression springs to make positive contact during testing.
3M(TM) DIP "Thru-Hole" Nail Head Test Clips
Nail head test clips allow for hands-free testing. Nail contact keeps probes and test leads from sliding off. The test clips have helical compression springs to make positive contact during testing.
3M(TM) DIP "Knife Edge" Test Clips
3M is pleased to introduce a family of "Knife Edge" test clips in all dual-in-line (DIP) sizes both U.S. and Shrink Dip versions. The clips feature a "Knife Edge" contact concentrating high normal force in a small area, the net effect is a concentration of forces that pierce the oxide or conformal coating.
3M(TM) DIP Long Wire Cable Assembly Compatible Test Clips
The long wire cable assembly compatible test clips are to be used in conjunction with standard connector and cable assemblies, i.e. 3M(TM) Logical Connector Cable Assemblies. Test clips have helical compression springs to make positive contact during testing.
3M(TM) Shrink DIP "Thru-Hole" Compatible Test Clips
The shrink dip family of IC packages was developed in Japan with lead centers on 0.070" rather than .100" as found on U.S. devices. These memory devices and controllers come in a variety of lead counts ranging from 20 to 64 leads.
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